Table of Contents

1: Introduction
2: Instrumental Aspects of AFM
3: AFM Modes
4: Measuring AFM Images
5: Image Processing in AFM
6: Image Artifacts in AFM
7: Applications of AFM
Appendix 1: AFM Standards and Calibration Specimens
Appendix 2: AFM Software

About the Author

Peter Eaton has more than ten years' experience in research using Atomic Force Microscopy. He has used a wide variety of AFM instruments in research centres and universities across Europe. He has used AFM to study pharmaceutical, chemical, materials science, nanotech and biological samples. He is the author of more than twenty research publications on AFM. Paul West has over twenty-five years' experience with the development of atomic force microscopes. He is the
co-founder of several AFM companies, the author of numerous patents, and co-author of several publications on the design and application of atomic force microscopes. He served on the United States
National Nanotechnology Initiative which resulted in the first major funding of nanotechnology research.

Reviews

Atomic Force Microscopy is a great introduction to AFMs for beginners and, although light on theory, also serves as a good starting point for more serious users.
*Udo D. Schwarz, Physics Today*

There is definitely room for a general book on AFM which concentrates on how to get the most from the instrument and teaches the beginner/moderately experienced user the 'tricks of the trade'.
*Jamie Hobbs, Sheffield University, UK*

Atomic Force Microscopy is the manual that should accompany any Atomic Force Microscope.
*Othmar Marti, University of Ulm, Germany*

I recommend this book to any reader who wants to enter the world of force microscopy. This book is easy to read, entertaining, with a practical approach.
*Carmen Serra, Nanotechnology and Surface Analysis Service, University of Vigo, Spain*