Table of Contents

1. Introduction and Preliminaries.- 2. Electrical Circuits of Ordinary Capacitors.- 3. Breakdown of Thin-Film Dielectrics.- 4. Cell Models for Dielectrics.- 5. Electrical Breakdown and the Breakdown Formalism.- 6. Statistical Properties of a Load-Sharing Bundle.- 7. Statistical Analysis of Kim and Lee (2004)'s Data.- 8. Circuits of Ordinary Capacitors.- 9. Size Effects Relationships Motivated by the Load-Sharing Cell Model.- 10. Concluding Comments and Future Research Directions.

About the Author

James U. Gleaton is Professor Emeritus in the Department of Mathematics and Statistics at the University of North Florida.

David Han is Associate Professor of Management Science and Statistics at the University of Texas at San Antonio.

James D. Lynch is Distinguished Professor Emeritus in the Department of Statistics at the University of South Carolina.

Hon Keung Tony Ng is Professor in the Department of Mathematical Sciences at Bentley University.

Fabrizio Ruggeri is Research Director at the Italian National Research Council in Milan.