Table of Contents

Quantification in AES and XPS (Seah). Surface analytical imaging (Prutton). Electronic structure and electron spectroscopy (Van der Laan). Auger electron spectroscopy in the STEM (Kruit). Electron energy-loss spectroscopy - EELS (Egerton). Light element microanalysis and imaging (Williams). A comparison of quantification methods and analytical techniques (Fitzgerald). Data analysis and processing (Trebbia). Microscopy and microanalysis of insulating materials (Cazaux). Electron specimen interactions (Joy). Electron probe x-ray microanalysis (Van Espen). Energy dispersive x-ray analysis (EDX) in the TEM/STEM (Titchmarsh). Analysis and imaging by proton-induced x-ray emission (PIXE) (Campbell). Ion-beam analytical techniques - Rutherford backscattering, elastic recoil and nuclear reaction analysis (Maydell). Quantitative analysis of solids by SIMS and SNMS (Wittmaack). Static SIMS (Briggs). Applications of surface, interface and thin film analysis in an industrial research laboratory (Werner). Ion-induced auger electron emission from solids (Fabian). Resonance ionisation mass spectroscopy (RIMS) (Ledingham). List of acronyms. Contributed papers by students. List of participants. Index.