We use cookies to provide essential features and services. By using our website you agree to our use of cookies .

×

Warehouse Stock Clearance Sale

Grab a bargain today!


RF Measurements of Die and Packages
By

Rating

Product Description
Product Details

Table of Contents

Preface. Introduction, Calibration, Coplanar Probes. High-Volume Probing. Test Fixtures. On-Wafer Characterization. RF Test Systems. Package Characterization. Future Trends. Appendix.

Ask a Question About this Product More...
 
This title is unavailable for purchase as none of our regular suppliers have stock available. If you are the publisher, author or distributor for this item, please visit this link.

Back to top