Table of Contents

Introduction.- Materials and Device Degradation.- From Material/Device Degradation to Time-To-Failure.- Time-To-Failure Modeling.- Gaussian Statistics – An Overview.- Time-To-Failure Statistics.- Failure Rate Modeling.- Accelerated Degradation.- Acceleration Factor Modeling.- Ramp-To-Failure Testing.- Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits Breakdown (TDDB).- Time-To-Failure Models for Selected Failure Mechanisms In Mechanical Engineering.- Conversion of Dynamical Stresses Into Effective Static Values.- Increasing the Reliability of Device/Product Designs.- Screening.- Heat Generation and Dissipation.- Sampling Plans and Confidence Intervals.- Appendix A: Useful Conversion Factors.- Appendix B: Useful Physical Constants.- Appendix C: Useful Rough Rules-Of-Thumb.- Appendix D: Useful Mathematical Expressions.- Appendix E: Useful Differentials and Definite Integrals.- Appendix F: Free-Energy.- Appendix G: t(1-α/2,ν) Distribution Values.- Appendix H: χ2(P,ν) Distribution Values.- Index.

About the Author

Dr. J.W. McPherson is at McPherson Reliability Consulting, LLC.